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If a chip has any TEST_BAD_* flag set, we don't even list the

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unsupported functions, giving the user the impression that the
unsupported functions are tested.

Signed-off-by: Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net>
Acked-by: Peter Stuge <peter@stuge.se>


git-svn-id: svn://svn.coreboot.org/coreboot/trunk@3780 2b7e53f0-3cfb-0310-b3e9-8179ed1497e1
This commit is contained in:
Carl-Daniel Hailfinger
2008-11-28 23:45:27 +00:00
parent f22ce41840
commit f86f1fe961
2 changed files with 11 additions and 6 deletions
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3
util/flashrom/flash.h
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@@ -95,6 +95,7 @@ struct flashchip {
#define TEST_BAD_READ (1<<5)
#define TEST_BAD_ERASE (1<<6)
#define TEST_BAD_WRITE (1<<7)
#define TEST_BAD_PREW (TEST_BAD_PROBE|TEST_BAD_READ|TEST_BAD_ERASE|TEST_BAD_WRITE)
#define TEST_BAD_MASK 0xf0
extern struct flashchip flashchips[];
@@ -106,7 +107,7 @@ extern struct flashchip flashchips[];
*
* All LPC/FWH parts (parallel flash) have 8-bit device IDs if there is no
* continuation code.
* All SPI parts have 16-bit device IDs.
* SPI parts have 16-bit device IDs if they support RDID.
*/
#define GENERIC_DEVICE_ID 0xffff /* Only match the vendor ID */