Michael D Kinney 0a989069df UnitTestFrameworkPkg/SampleGoogleTest: Use EXPECT_ANY_THROW()
REF: https://bugzilla.tianocore.org/show_bug.cgi?id=4683

Update GoogleTest samples to use EXPECT_ANY_THROW() instead
of ASSERT_DEATH(). ASSERT_DEATH() is a very slow method to
detect an expected ASSERT() condition. Throwing an exception
from ASSERT() and using EXPECT_ANY_THROW() is several orders
of magnitude faster.

Update GoogleTest sample with example of using EXPECT_THROW()
and EXPECT_THAT() to check for more specific ASSERT() conditions
that allow unit test cases to test functions that contain
more than one ASSERT() statement and verify that the expected
ASSERT() is the one that was actually triggered.

Update library mappings so target-based unit tests use
UnitTestDebugAssertLib.inf and host-based unit tests use
UnitTestDebugAssertLibHost.inf

Cc: Michael Kubacki <mikuback@linux.microsoft.com>
Cc: Sean Brogan <sean.brogan@microsoft.com>
Signed-off-by: Michael D Kinney <michael.d.kinney@intel.com>
Reviewed-by: Michael Kubacki <michael.kubacki@microsoft.com>
2024-02-14 02:37:16 +00:00

306 lines
7.4 KiB
C++

/** @file
This is a sample to demonstrates the use of GoogleTest that supports host
execution environments.
Copyright (c) 2022, Intel Corporation. All rights reserved.<BR>
SPDX-License-Identifier: BSD-2-Clause-Patent
**/
#include <Library/GoogleTestLib.h>
extern "C" {
#include <Uefi.h>
#include <Library/BaseLib.h>
#include <Library/DebugLib.h>
}
/**
Sample unit test that verifies the expected result of an unsigned integer
addition operation.
**/
TEST (SimpleMathTests, OnePlusOneShouldEqualTwo) {
UINTN A;
UINTN B;
UINTN C;
A = 1;
B = 1;
C = A + B;
ASSERT_EQ (C, (UINTN)2);
}
/**
Sample unit test that verifies that a global BOOLEAN is updatable.
**/
class GlobalBooleanVarTests : public ::testing::Test {
public:
BOOLEAN SampleGlobalTestBoolean = FALSE;
};
TEST_F (GlobalBooleanVarTests, GlobalBooleanShouldBeChangeable) {
SampleGlobalTestBoolean = TRUE;
ASSERT_TRUE (SampleGlobalTestBoolean);
SampleGlobalTestBoolean = FALSE;
ASSERT_FALSE (SampleGlobalTestBoolean);
}
/**
Sample unit test that logs a warning message and verifies that a global
pointer is updatable.
**/
class GlobalVarTests : public ::testing::Test {
public:
VOID *SampleGlobalTestPointer = NULL;
protected:
void
SetUp (
) override
{
ASSERT_EQ ((UINTN)SampleGlobalTestPointer, (UINTN)NULL);
}
void
TearDown (
)
{
SampleGlobalTestPointer = NULL;
}
};
TEST_F (GlobalVarTests, GlobalPointerShouldBeChangeable) {
SampleGlobalTestPointer = (VOID *)-1;
ASSERT_EQ ((UINTN)SampleGlobalTestPointer, (UINTN)((VOID *)-1));
}
/**
Set PcdDebugPropertyMask for each MacroTestsAssertsEnabledDisabled test
**/
class MacroTestsAssertsEnabledDisabled : public testing::TestWithParam<UINT8> {
void
SetUp (
)
{
PatchPcdSet8 (PcdDebugPropertyMask, GetParam ());
}
};
/**
Sample unit test using the ASSERT_TRUE() macro.
**/
TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertTrue) {
UINT64 Result;
//
// This test passes because expression always evaluated to TRUE.
//
ASSERT_TRUE (TRUE);
//
// This test passes because expression always evaluates to TRUE.
//
Result = LShiftU64 (BIT0, 1);
ASSERT_TRUE (Result == BIT1);
}
/**
Sample unit test using the ASSERT_FALSE() macro.
**/
TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertFalse) {
UINT64 Result;
//
// This test passes because expression always evaluated to FALSE.
//
ASSERT_FALSE (FALSE);
//
// This test passes because expression always evaluates to FALSE.
//
Result = LShiftU64 (BIT0, 1);
ASSERT_FALSE (Result == BIT0);
}
/**
Sample unit test using the ASSERT_EQ() macro.
**/
TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertEqual) {
UINT64 Result;
//
// This test passes because both values are always equal.
//
ASSERT_EQ (1, 1);
//
// This test passes because both values are always equal.
//
Result = LShiftU64 (BIT0, 1);
ASSERT_EQ (Result, (UINT64)BIT1);
}
/**
Sample unit test using the ASSERT_STREQ() macro.
**/
TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertMemEqual) {
CHAR8 *String1;
CHAR8 *String2;
//
// This test passes because String1 and String2 are the same.
//
String1 = (CHAR8 *)"Hello";
String2 = (CHAR8 *)"Hello";
ASSERT_STREQ (String1, String2);
}
/**
Sample unit test using the ASSERT_NE() macro.
**/
TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEqual) {
UINT64 Result;
//
// This test passes because both values are never equal.
//
ASSERT_NE (0, 1);
//
// This test passes because both values are never equal.
//
Result = LShiftU64 (BIT0, 1);
ASSERT_NE (Result, (UINT64)BIT0);
}
/**
Sample unit test using the ASSERT_TRUE() and ASSERT(FALSE)
and EFI_EFFOR() macros to check status
**/
TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotEfiError) {
//
// This test passes because the status is not an EFI error.
//
ASSERT_FALSE (EFI_ERROR (EFI_SUCCESS));
//
// This test passes because the status is not an EFI error.
//
ASSERT_FALSE (EFI_ERROR (EFI_WARN_BUFFER_TOO_SMALL));
}
/**
Sample unit test using the ASSERT_EQ() macro to compare EFI_STATUS values.
**/
TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertStatusEqual) {
//
// This test passes because the status value are always equal.
//
ASSERT_EQ (EFI_SUCCESS, EFI_SUCCESS);
}
/**
Sample unit test using ASSERT_NE() macro to make sure a pointer is not NULL.
**/
TEST_P (MacroTestsAssertsEnabledDisabled, MacroAssertNotNull) {
UINT64 Result;
//
// This test passes because the pointer is never NULL.
//
ASSERT_NE (&Result, (UINT64 *)NULL);
}
/**
Sample unit test using that should not generate any ASSERTs()
**/
TEST_P (MacroTestsAssertsEnabledDisabled, MacroExpectNoAssertFailure) {
//
// This test passes because it never triggers an ASSERT().
//
ASSERT (TRUE);
//
// This test passes because DecimalToBcd() does not ASSERT() if the
// value passed in is <= 99.
//
DecimalToBcd8 (99);
}
/**
Sample unit test using the EXPECT_ANY_THROW() macro to test expected ASSERT()s.
**/
TEST_P (MacroTestsAssertsEnabledDisabled, MacroExpectAssertFailure) {
//
// Skip tests that verify an ASSERT() is triggered if ASSERT()s are disabled.
//
if ((PcdGet8 (PcdDebugPropertyMask) & BIT0) == 0x00) {
return;
}
//
// This test passes because it directly triggers an ASSERT().
//
EXPECT_ANY_THROW (ASSERT (FALSE));
//
// This test passes because DecimalToBcd() generates an ASSERT() if the
// value passed in is >= 100. The expected ASSERT() is caught by the unit
// test framework and EXPECT_ANY_THROW() returns without an error.
//
EXPECT_ANY_THROW (DecimalToBcd8 (101));
//
// This test passes because DecimalToBcd() generates an ASSERT() if the
// value passed in is >= 100. The expected ASSERT() is caught by the unit
// test framework and throws the C++ exception of type std::runtime_error.
// EXPECT_THROW() returns without an error.
//
EXPECT_THROW (DecimalToBcd8 (101), std::runtime_error);
//
// This test passes because DecimalToBcd() generates an ASSERT() if the
// value passed in is >= 100. The expected ASSERT() is caught by the unit
// test framework and throws the C++ exception of type std::runtime_error with
// a message that includes the filename, linenumber, and the expression that
// triggered the ASSERT().
//
// EXPECT_THROW_MESSAGE() calls DecimalToBcd() expecting DecimalToBds() to
// throw a C++ exception of type std::runtime_error with a message that
// includes the expression of "Value < 100" that triggered the ASSERT().
//
EXPECT_THROW_MESSAGE (DecimalToBcd8 (101), "Value < 100");
}
INSTANTIATE_TEST_SUITE_P (
ValidInput,
MacroTestsAssertsEnabledDisabled,
::testing::Values (PcdGet8 (PcdDebugPropertyMask) | BIT0, PcdGet8 (PcdDebugPropertyMask) & (~BIT0))
);
/**
Sample unit test using the SCOPED_TRACE() macro for trace messages.
**/
TEST (MacroTestsMessages, MacroTraceMessage) {
//
// Example of logging.
//
SCOPED_TRACE ("SCOPED_TRACE message\n");
//
// Always pass
//
ASSERT_TRUE (TRUE);
}
int
main (
int argc,
char *argv[]
)
{
testing::InitGoogleTest (&argc, argv);
return RUN_ALL_TESTS ();
}