git-svn-id: https://edk2.svn.sourceforge.net/svnroot/edk2/trunk/edk2@3 6f19259b-4bc3-4df7-8a09-765794883524
		
			
				
	
	
		
			33 lines
		
	
	
		
			1.2 KiB
		
	
	
	
		
			C
		
	
	
	
	
	
			
		
		
	
	
			33 lines
		
	
	
		
			1.2 KiB
		
	
	
	
		
			C
		
	
	
	
	
	
| /*++
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| 
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| Copyright (c) 2006, Intel Corporation                                                         
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| All rights reserved. This program and the accompanying materials                          
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| are licensed and made available under the terms and conditions of the BSD License         
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| which accompanies this distribution.  The full text of the license may be found at        
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| http://opensource.org/licenses/bsd-license.php                                            
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|                                                                                           
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| THE PROGRAM IS DISTRIBUTED UNDER THE BSD LICENSE ON AN "AS IS" BASIS,                     
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| WITHOUT WARRANTIES OR REPRESENTATIONS OF ANY KIND, EITHER EXPRESS OR IMPLIED.             
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| 
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| Module Name:
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| 
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|   CompatibleMemoryTested.h
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|     
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| Abstract:
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| 
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|   Tiano Guid used for all Compatible Memory Range Tested GUID.  
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| 
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| --*/
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| 
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| #ifndef _COMPATIBLE_MEMORY_TESTED_GUID_H_
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| #define _COMPATIBLE_MEMORY_TESTED_GUID_H_
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| 
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| #define EFI_COMPATIBLE_MEMORY_TESTED_PROTOCOL_GUID \
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|   { \
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|     0x64c475ef, 0x344b, 0x492c, 0x93, 0xad, 0xab, 0x9e, 0xb4, 0x39, 0x50, 0x4 \
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|   }
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| 
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| extern EFI_GUID gEfiCompatibleMemoryTestedGuid;
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| 
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| #endif
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